The approximation of X-ray diffraction profiles of thermally reduced nanostructured derivatives of graphene oxide. N.S. SAENKO, A.M. ZIATDINOV

Abstract

The approximation of X-ray diffraction profiles of thermally reduced nanostructured derivatives of graphene oxide. N.S. SAENKO, A.M. ZIATDINOV (Institute of Chemistry, FEB RAS, Vladivostok).

The paper outlines the procedure of modeling X-ray diffractogram of films for thermally reduced nanostructured graphene oxide derivatives using a linear combination of the theoretical profiles for powders of quasi-two-dimensional misoriented few-layer turbostratic nanographenes (nanographites). The method allows us to determine the relative content of nanographites with various average sizes and number of layers, as well as a probability density function characterizing the fraction of particles in the powder, which is rotated by a certain polar angle. The proposed modeling procedure is also suitable for the approximation of experimental X-ray diffractograms of any materials containing extended quasi-two-dimensional misoriented structures of turbostratic nanographites.